| 000 | 00639nam a22002177a 4500 | ||
|---|---|---|---|
| 001 | 30756 | ||
| 003 | BD-DhUET | ||
| 008 | 150625b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a8178087693 | ||
| 040 |
_c0 _dBD-DhUET |
||
| 082 |
_a623.815 _bCHA/2002 |
||
| 100 | _aChakraborty, Kanad | ||
| 245 | _aFault-Tolerance and reliability techniques for high-density random-access memories | ||
| 250 | _a1st ed. | ||
| 260 |
_aNew Delhi _bPrentice-Hall of India _c2002 |
||
| 300 |
_axix, 426p. _bill. |
||
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aPower semiconductors - Design and construction | |
| 700 | _aMazumder, Pinaki | ||
| 942 | _cGB | ||
| 999 |
_c30756 _d30756 |
||