| 000 | 00792nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | 3589 | ||
| 003 | BD-DhUET | ||
| 008 | 910329s1991 maua b 001 0 eng | ||
| 020 | _a0792391659 | ||
| 040 |
_aDLC _cDLC _dBD-DhUET |
||
| 082 |
_a623.95 _bCHA/1991 |
||
| 100 | 1 | _aChakradhar, Srimat T. | |
| 245 | 1 | 0 |
_aNeural models and algorithms for digital testing _cby Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell. |
| 250 | _aIst ed | ||
| 260 |
_aBoston : _bKluwer Academic Publishers, _c1991. |
||
| 300 |
_axii, 184 p. : _bill. ; _c25 cm. |
||
| 490 | 1 | _aThe Kluwer international series in engineering and computer science ; | |
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aLogic circuits | |
| 700 | 1 | _aAgrawal, Vishwani D., | |
| 700 | 1 | _aBushnell, Michael L. | |
| 942 | _cGB | ||
| 999 |
_c3589 _d3589 |
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