| 000 | 00576nam a2200217 a 4500 | ||
|---|---|---|---|
| 001 | 40466 | ||
| 003 | BD-DhUET | ||
| 008 | 980309s1998 enka b 001 0 eng d | ||
| 020 | _a0850667585 | ||
| 040 |
_aMCM-L _cMCM-L _dBD-DhUET |
||
| 082 | 0 | 0 |
_a548.83 _bBOW/1998 |
| 100 | 1 | _aBowen, D. Keith | |
| 245 | 1 | 0 | _aHigh resolution X-ray diffractometry and topography |
| 250 | _a1st ed. | ||
| 260 |
_aLondon _bTaylor & Francis _c1998 |
||
| 300 | _ax, 252 p. | ||
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aX-ray crystallography | |
| 700 | _aTanner, Brian K. | ||
| 942 | _cGB | ||
| 999 |
_c40466 _d40466 |
||