| 000 | 00679nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | 40695 | ||
| 003 | BD-DhUET | ||
| 008 | 990405s1999 enka b 001 0 eng | ||
| 020 | _a0198501897 | ||
| 040 |
_aDLC _cDLC _dBD-DhUET |
||
| 082 | 0 | 0 |
_a548.83 _bSNY/1999 |
| 100 | _aSnyder, Robert L. | ||
| 245 | 1 | 0 | _aDefect and microstructure analysis by diffraction |
| 250 | _a1st ed. | ||
| 260 |
_aOxford _bOxford University Press _c1999 |
||
| 300 | _axxii, 785 p. | ||
| 490 | _aInternational union of crystallography book series | ||
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aX-ray crystallography | |
| 700 | _aFiala, Jaroslav | ||
| 700 | _aBunge, Hans J. | ||
| 942 | _cGB | ||
| 999 |
_c40695 _d40695 |
||