000 00797nam a2200241 a 4500
001 4879
003 BD-DhUET
008 960710s1997 nyua b 001 0 eng
020 _a007017024X
040 _aDLC
_cDLC
_dBD-DhUET
082 _a623.815
_bGIA/1997
100 _aGiacomo, Giulio di
245 1 0 _aReliability of electronic packages and semiconductor devices
_cby Giulio di Giacomo
250 _a1st ed.
260 _aNew York
_bMcGraw-Hill
_c1997
300 _axiv, 410 p.
_bill.
_c24 cm.
490 _aElectronic Packaging and Interconnection Series
504 _aIncludes bibliographies
650 0 _aReliability (Semiconductor)
942 _cGB
856 4 2 _uhttp://www.loc.gov/catdir/description/mh022/96029181.html
856 4 1 _uhttp://www.loc.gov/catdir/toc/mh022/96029181.html
999 _c4879
_d4879