000 | 00797nam a2200241 a 4500 | ||
---|---|---|---|
001 | 4879 | ||
003 | BD-DhUET | ||
008 | 960710s1997 nyua b 001 0 eng | ||
020 | _a007017024X | ||
040 |
_aDLC _cDLC _dBD-DhUET |
||
082 |
_a623.815 _bGIA/1997 |
||
100 | _aGiacomo, Giulio di | ||
245 | 1 | 0 |
_aReliability of electronic packages and semiconductor devices _cby Giulio di Giacomo |
250 | _a1st ed. | ||
260 |
_aNew York _bMcGraw-Hill _c1997 |
||
300 |
_axiv, 410 p. _bill. _c24 cm. |
||
490 | _aElectronic Packaging and Interconnection Series | ||
504 | _aIncludes bibliographies | ||
650 | 0 | _aReliability (Semiconductor) | |
942 | _cGB | ||
856 | 4 | 2 | _uhttp://www.loc.gov/catdir/description/mh022/96029181.html |
856 | 4 | 1 | _uhttp://www.loc.gov/catdir/toc/mh022/96029181.html |
999 |
_c4879 _d4879 |