| 000 | 00788nam a22002654a 4500 | ||
|---|---|---|---|
| 001 | 8253 | ||
| 003 | BD-DhUET | ||
| 008 | 020803s2003 nyua b 001 0 eng | ||
| 020 | _a9780306472923 | ||
| 040 |
_aDLC _cDLC _dBD-DhUET |
||
| 082 | 0 | 0 |
_a502.82 _bGOL/2003 |
| 100 | _aGoldstein, Joseph I. | ||
| 245 | 0 | 0 | _aScanning electron microscopy and x-ray microanalysis |
| 250 | _a3rd ed. | ||
| 260 |
_aNew York _bSpringer Science _c2003 |
||
| 300 |
_axix,689p. _bill. (some col.) _c26 cm. |
||
| 500 | _aWith one CD-ROM | ||
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aScanning electron microscopy | |
| 700 | _aNewbury, Dale E. | ||
| 700 | _aEchlin, Patrick | ||
| 700 | _aJoy, David C. | ||
| 856 | 4 | 2 | _uhttp://www.loc.gov/catdir/enhancements/fy0813/2002028276-d.html |
| 942 | _cGB | ||
| 999 |
_c8253 _d8253 |
||