000			00735nam a2200229 a 4500
001			8379
003			BD-DhUET
008			980513s1998 paua b 101 0 eng
020			_a0803124899
040			_aDLC _cDLC _dBD-DhUET
082			_a623.815 _bWOR/1998
111			_aWorkshop on silicon recombination lifetime characterization methods _cSanta Clara _d06/02/1997
245	0	0	_aRecombination lifetime measurements in silicon
260			_aWest Conshohocken _bASTM _c1998
300			_a392 p. _bill. _c24 cm.
490			_a ASTM special technical publication;1340
504			_aIncludes bibliographies
650		0	_aSemiconductors
700			_aGupta, Dinesh C.
711			_aSponsord by SEMI and ASTM Committee F1
942			_cPRC
999			_c8379 _d8379