| 000 | 00538nam a2200205 i 4500 | ||
|---|---|---|---|
| 001 | 9947 | ||
| 003 | BD-DhUET | ||
| 008 | 750607s1975 nyua b 001 0 eng | ||
| 020 | _a070856443 | ||
| 040 |
_aDLC _cDLC _dBD-DhUET |
||
| 082 | 0 | 0 |
_a537.622 _bRUN/1975 |
| 100 | 1 | _aRunyan, W. R. | |
| 245 | 1 | 0 | _aSemiconductor measurements and instrumentation |
| 250 | _a1st. ed. | ||
| 260 |
_aNew York _bMcGraw-Hill _c1975 |
||
| 300 |
_avii, 280 p. _bill. _c26 cm. |
||
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aSemiconductors | |
| 942 | _cGB | ||
| 999 |
_c9947 _d9947 |
||