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Effects of dynamic stress induced charge trapping in stack gate dielectrics of scaled mos devices
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| dc.contributor.advisor | Khosru, Dr. Quazi Deen Mohd. | |
| dc.contributor.author | Sonia Ahsan | |
| dc.date.accessioned | 2016-06-26T03:49:25Z | |
| dc.date.available | 2016-06-26T03:49:25Z | |
| dc.date.issued | 2009-08-11 | |
| dc.identifier.uri | http://lib.buet.ac.bd:8080/xmlui/handle/123456789/3375 | |
| dc.description.abstract | For abstracts please see full text | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Department of Electrical and Electronic Engineering, BUET | en_US |
| dc.subject | MOSFET | en_US |
| dc.title | Effects of dynamic stress induced charge trapping in stack gate dielectrics of scaled mos devices | en_US |
| dc.type | Thesis-MSc | en_US |
| dc.contributor.id | 100606230 P | en_US |
| dc.identifier.accessionNumber | 107307 | |
| dc.contributor.callno | 623.9732/SON/2009 | en_US |
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Dissertation/Theses - Department of Electrical and Electronic Engineering
Post graduate dissertations (Thesis) of Electrical and Electronic Engineering (EEE)