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Modeling of direct tunneling gate current and gate capacitance in deep submicron MOSFETs with high-K dielectric
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Modeling of direct tunneling gate current and gate capacitance in deep submicron MOSFETs with high-K dielectric
Mojammel Al Hakim, Mohammad
URI:
http://lib.buet.ac.bd:8080/xmlui/handle/123456789/3606
Date:
2002-03-03
Abstract:
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Dissertations/Theses - Department of Electrical and Electronic Engineering
Post graduate dissertations (Theses) of Electrical and Electronic Engineering (EEE)
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