DSpace Repository

Testability analysis of complementary pass transistor logic circuits

Show simple item record

dc.contributor.advisor Harun-ur-Rashid, Dr. A. B. M.
dc.contributor.author Muzahidul Karim, Mohammad
dc.date.accessioned 2016-08-16T03:30:52Z
dc.date.available 2016-08-16T03:30:52Z
dc.date.issued 2001-06-26
dc.identifier.uri http://lib.buet.ac.bd:8080/xmlui/handle/123456789/3656
dc.description.abstract For abstracts please see full text en_US
dc.language.iso en en_US
dc.publisher Department of Electrical and Electronic Engineering, BUET en_US
dc.subject Testability analysis en_US
dc.subject Complementary pass en_US
dc.subject Transistor logic circuit en_US
dc.title Testability analysis of complementary pass transistor logic circuits en_US
dc.type Thesis-MSc en_US
dc.contributor.id 9506235 F en_US
dc.identifier.accessionNumber 95412
dc.contributor.callno 623.81530422/MUZ/2001 en_US


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search BUET IR


Advanced Search

Browse

My Account