Alven, William H. Von
Semiconductor reliability - 12st ed. - New Jersey Engineering Publishers 1962 - xvi, 400 p. ill. 24 cm.
Vol. 2, Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961
Includes bibliographies
Semiconductors
623.815 / ALV/1962
Semiconductor reliability - 12st ed. - New Jersey Engineering Publishers 1962 - xvi, 400 p. ill. 24 cm.
Vol. 2, Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961
Includes bibliographies
Semiconductors
623.815 / ALV/1962