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Semiconductor reliability

by Alven, William H. Von.
Publisher: New Jersey Engineering Publishers 1962Edition: 12st ed.Description: xvi, 400 p. ill. 24 cm.Subject(s): Semiconductors
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Item type Current location Call number Copy number Status Date due Barcode
Edited Book Central Library, BUET
Circulation section 		623.815/ALV/1962 (Browse shelf) 1 Available 12261
Edited Book Central Library, BUET
Circulation section 		623.815/ALV/1962 (Browse shelf) 2 Available 11519

Vol. 2, Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961

Includes bibliographies

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