Koha online catalog › ISBD view

Normal view MARC view ISBD view

Strausser, Yale

Characterization in silicon processing - 1st ed. - New York Momentum Press 2010 - xiii, 240 p. ill. 25 cm. - Materials characterization series .

Includes bibliographies

ISBN: 9781606501115 1606501119 9781606501092 1606501097

Subjects--Topical Terms:
Silicon
Electric conductors

Dewey Class. No.: 620.1 / STR/2010

Place hold
Print
Add to your cart (remove)
Save record
More searches