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Characterization in silicon processing

by Strausser, Yale.
Series: Materials characterization series.Publisher: New York Momentum Press 2010Edition: 1st ed.Description: xiii, 240 p. ill. 25 cm.ISBN: 9781606501115 ; 1606501119 ; 9781606501092 ; 1606501097.Subject(s): Silicon | Electric conductors
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Item type Current location Call number Copy number Status Date due Barcode
Edited Book Central Library, BUET
Reading section 		620.1/STR/2010 (Browse shelf) 1 Available 109718

Includes bibliographies

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