Haddara, Hisham
Characterization methods for submicron MOSFETs - 1st ed. - Boston Kluwer Academic Publishers 1995 - vii, 232p. ill. - The Kluwer international series in engineering and computer science ; .
Includes bibliographies
0792396952
Metal oxide semiconductor field - Effect transistors
623.9732 / HAD/1995
Characterization methods for submicron MOSFETs - 1st ed. - Boston Kluwer Academic Publishers 1995 - vii, 232p. ill. - The Kluwer international series in engineering and computer science ; .
Includes bibliographies
0792396952
Metal oxide semiconductor field - Effect transistors
623.9732 / HAD/1995