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Characterization methods for submicron MOSFETs

by Haddara, Hisham.
Series: Publisher: Boston Kluwer Academic Publishers 1995Edition: 1st ed.Description: vii, 232p. ill.ISBN: 0792396952 .Subject(s): Metal oxide semiconductor field - Effect transistors
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Item type Current location Call number Copy number Status Date due Barcode
Edited Book Central Library, BUET
Reading section 		623.9732/HAD/1995 (Browse shelf) 1 Available 93109
Reading Item Central Library, BUET
Reading section 		623.9732/HAD/1995 (Browse shelf) 2 Available 93110

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