Chakraborty, Kanad
Fault-Tolerance and reliability techniques for high-density random-access memories - 1st ed. - New Delhi Prentice-Hall of India 2002 - xix, 426p. ill.
Includes bibliographies
8178087693
Power semiconductors - Design and construction
623.815 / CHA/2002
Fault-Tolerance and reliability techniques for high-density random-access memories - 1st ed. - New Delhi Prentice-Hall of India 2002 - xix, 426p. ill.
Includes bibliographies
8178087693
Power semiconductors - Design and construction
623.815 / CHA/2002