| 000 -LEADER |
|---|
| fixed length control field |
00639nam a22002177a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
30756 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
BD-DhUET |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
150625b xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
8178087693 |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
0 |
| Modifying agency |
BD-DhUET |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
623.815 |
| Item number |
CHA/2002 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Chakraborty, Kanad |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Fault-Tolerance and reliability techniques for high-density random-access memories |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
1st ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc. |
New Delhi |
| Name of publisher, distributor, etc. |
Prentice-Hall of India |
| Date of publication, distribution, etc. |
2002 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xix, 426p. |
| Other physical details |
ill. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc |
Includes bibliographies |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Power semiconductors - Design and construction |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Mazumder, Pinaki |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
General Book |