Bowen, D. Keith
High resolution X-ray diffractometry and topography - 1st ed. - London Taylor & Francis 1998 - x, 252 p.
Includes bibliographies
0850667585
X-ray crystallography
548.83 / BOW/1998
High resolution X-ray diffractometry and topography - 1st ed. - London Taylor & Francis 1998 - x, 252 p.
Includes bibliographies
0850667585
X-ray crystallography
548.83 / BOW/1998