High resolution X-ray diffractometry and topography
by Bowen, D. Keith; Tanner, Brian K.
Publisher: London Taylor & Francis 1998Edition: 1st ed.Description: x, 252 p.ISBN: 0850667585.Subject(s): X-ray crystallography| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Book | Central Library, BUET Reading section | 548.83/BOW/1998 (Browse shelf) | 1 | Available | 115383 |
Includes bibliographies
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