Goldstein, Joseph I.
Scanning electron microscopy and x-ray microanalysis - 3rd ed. - New York Springer Science 2003 - xix,689p. ill. (some col.) 26 cm.
With one CD-ROM
Includes bibliographies
9780306472923
Scanning electron microscopy
502.82 / GOL/2003
Scanning electron microscopy and x-ray microanalysis - 3rd ed. - New York Springer Science 2003 - xix,689p. ill. (some col.) 26 cm.
With one CD-ROM
Includes bibliographies
9780306472923
Scanning electron microscopy
502.82 / GOL/2003