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Scanning electron microscopy and x-ray microanalysis

by Goldstein, Joseph I; Newbury, Dale E; Echlin, Patrick; Joy, David C.
Publisher: New York Springer Science 2003Edition: 3rd ed.Description: xix,689p. ill. (some col.) 26 cm.ISBN: 9780306472923.Subject(s): Scanning electron microscopyOnline resources: Click here to access online
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Item type Current location Call number Copy number Status Date due Barcode
General Book Central Library, BUET
Circulation section 		502.82/GOL/2003 (Browse shelf) 1 Available 112700

With one CD-ROM

Includes bibliographies

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