Effect of thermal aging on electromigration failure of a flip-chip SnAgCu solder joint (Record no. 42014)

000 -LEADER
fixed length control field 00705nam a2200217 4500
001 - CONTROL NUMBER
control field 42014
003 - CONTROL NUMBER IDENTIFIER
control field BD-DhUET
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 190911b xxu||||| |||| 00| 0 eng d
040 ## - CATALOGING SOURCE
Transcribing agency 0
Modifying agency BD-DhUET
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.1123
Item number TUS/2019
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Tusher Ahmed, Md.
245 ## - TITLE STATEMENT
Title Effect of thermal aging on electromigration failure of a flip-chip SnAgCu solder joint
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. Dhaka
Name of publisher, distributor, etc. Department of Mechanical Engineering
Date of publication, distribution, etc. 2019
300 ## - PHYSICAL DESCRIPTION
Extent xvi, 114 p.
501 ## - WITH NOTE
With note One CD-ROM
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographies
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Materials-Mechanical properties
720 ## - ADDED ENTRY--UNCONTROLLED NAME
Thesis Supervisor Dr. Mohammad Abdul Motalab
Relator term M.Sc. Thesis
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://lib.buet.ac.bd:8080/xmlui/handle/123456789/5421
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Thesis
Holdings
Koha date last seen Sublocation or collection (holding branch) Not for loan Lost status Date acquired Location (home branch) Shelving location Koha item type Source of classification or shelving scheme Copy number Price effective from Koha full call number Damaged status Withdrawn status Piece designation (barcode) Koha normalized classification for sorting
2019-09-11Central Library, BUET  2019-08-27Central Library, BUETReference sectionThesis 12019-09-11620.1123/TUS/2019  117214620_112300000000000_TUS_2019