| 000 -LEADER |
|---|
| fixed length control field |
00735nam a2200229 a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
8379 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
BD-DhUET |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
980513s1998 paua b 101 0 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0803124899 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
DLC |
| Transcribing agency |
DLC |
| Modifying agency |
BD-DhUET |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
623.815 |
| Item number |
WOR/1998 |
| 111 ## - MAIN ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
Workshop on silicon recombination lifetime characterization methods |
| Location of meeting |
Santa Clara |
| Date of meeting |
06/02/1997 |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
Recombination lifetime measurements in silicon |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc. |
West Conshohocken |
| Name of publisher, distributor, etc. |
ASTM |
| Date of publication, distribution, etc. |
1998 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
392 p. |
| Other physical details |
ill. |
| Dimensions |
24 cm. |
| 490 ## - SERIES STATEMENT |
|---|
| Series statement |
ASTM special technical publication;1340 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc |
Includes bibliographies |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Semiconductors |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Gupta, Dinesh C. |
| 711 ## - ADDED ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
Sponsord by SEMI and ASTM Committee F1 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Proceedings |