Scanning probe microscopy : atomic scale engineering by forces and currents.
by Foster, Adam S; Hofer, Werner A.
Publisher: New York : Springer Science. 2006Edition: 1st ed.Description: xiv, 281 p. : ill. ; 25 cm.ISBN: 9780387400907; 0387400907.Subject(s): Scanning probe microscopyOnline resources: Click here to access online | Click here to access online| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
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| General Book | Central Library, BUET Circulation section | 623.815/FOS/2006 (Browse shelf) | 1 | Available | 103591 | |
| General Book | Central Library, BUET Circulation section | 623.815/FOS/2006 (Browse shelf) | 2 | Available | 103592 |
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| 623.815/FLO/1999 Electronic devices | 623.815/FLO/2008 Electronic devices | 623.815/FOS/2006 Nanotechnology | 623.815/FOS/2006 Scanning probe microscopy : | 623.815/FOS/2006 Scanning probe microscopy : | 623.815/FOS/2006 Nanotechnology | 623.815/FOS/2006 Nanotechnology |
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