IDDQ testing of VLSI circuits
by Gulati, Ravi K; Hawkins, Charles F.
Publisher: Boston Kluwer Academic Publishers 1993Edition: 1st ed.Description: 120 p. ill.ISBN: 0792393155.Subject(s): Integrated circuits - Very large scale integration - TestingItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Reading Item | Central Library, BUET Reading section | 623.95/GUL/1993 (Browse shelf) | 1 | Available | 90604 |
Browsing Central Library, BUET Shelves , Shelving location: Reading section Close shelf browser
623.95/DEW/1990 Principles of VLSI system planning | 623.95/FLO/1994 Basic operational amplifiers and linear integrated circuits | 623.95/GHO/1992 Sequential logic testing and verification | 623.95/GUL/1993 IDDQ testing of VLSI circuits | 623.95/KAN/2003 CMOS digital integrated circuits | 623.95/KUO/1998 CMOS VLSI engineering | 623.95/LEB/1993 Hot-carrier reliability of MOS VLSI circuits |
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