Analog and mixed-signal boundary-scan a guide to the IEEE 1149.4 test standard
by Osseiran, Adam.
Series: Frontiers in electronic testing.Publisher: Boston Kluwer Academic Publishers 1999Edition: 1st ed.Description: xviii, 155 p. ill. 24 cm.ISBN: 0792386868.Subject(s): Signal processingItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Reading Item | Central Library, BUET Reading section | 623.8043/OSS/1999 (Browse shelf) | 1 | Available | 95103 |
Browsing Central Library, BUET Shelves , Shelving location: Reading section Close shelf browser
623.8043/MIT/1998 Digital signal processing | 623.8043/MIT/1998 Digital signal processing | 623.8043/NAT/1999 Radar design principles | 623.8043/OSS/1999 Analog and mixed-signal boundary-scan | 623.8043/PRO/1996 Digital signal processing | 623.8043/PRO/1996 Digital signal processing | 623.8043/ROB/1987 Digital signal processing |
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