Defect and microstructure analysis by diffraction
by Snyder, Robert L; Fiala, Jaroslav; Bunge, Hans J.
Series: International union of crystallography book series.Publisher: Oxford Oxford University Press 1999Edition: 1st ed.Description: xxii, 785 p.ISBN: 0198501897.Subject(s): X-ray crystallographyItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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General Book | Central Library, BUET Reading section | 548.83/SNY/1999 (Browse shelf) | 1 | Available | 115687 |
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548.83/DAV/2002 Structure determination from powder diffraction data | 548.83/JEN/1996 Introduction to X-ray powder diffractometry | 548.83/PEC/2009 Fundamentals of powder diffraction and structural characterization of materials | 548.83/SNY/1999 Defect and microstructure analysis by diffraction | 548.83/YOU/1993 Rietveld method | 548.84/KOC/1998 Texture and anisotropy | 548.9/KAT/2008 Liquid crystalline functional assemblies and their supramolecular structures |
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