Defect and microstructure analysis by diffraction
by Snyder, Robert L; Fiala, Jaroslav; Bunge, Hans J.
Series: International union of crystallography book series.Publisher: Oxford Oxford University Press 1999Edition: 1st ed.Description: xxii, 785 p.ISBN: 0198501897.Subject(s): X-ray crystallography| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Book | Central Library, BUET Reading section | 548.83/SNY/1999 (Browse shelf) | 1 | Available | 115687 |
Includes bibliographies
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