Transmission electron microscopy of silicon VLSI circuits and structures
by Marcus, R. B; Sheng, T. T.
Publisher: New York John Wiley & Sons 1983Edition: 1st ed.Description: x, 217p. ill. 29 cm.ISBN: 0471092517 .Subject(s): Integrated circuitsItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
General Book | Central Library, BUET Circulation section | 623.8173/MAR/1983 (Browse shelf) | 1 | Available | 75497 |
Includes bibliographies
There are no comments for this item.