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Semiconductor reliability

by Alven, William H. Von.

Edition: 12st ed.Publisher: New Jersey Engineering Publishers 1962Availability: Items available for loan: Central Library, BUET [623.815/ALV/1962] (2).

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Subminiature electron tube life factors

by -- General Electronic Company

Edition: 1st ed.Publisher: Elizabeth Engineering Publishers 1961Availability: Items available for loan: Central Library, BUET [623.8151/GEN/1961] (4).

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Electronic maintainability

by Ankenbrandt, F. L. -- Electronic Industries Association

Edition: 1st ed.Publisher: New Jersey Engineering Publishers 1960Availability: Items available for loan: Central Library, BUET [626.73/ELE/1960] (1).

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