Characterization in silicon processing
by Strausser, Yale.
Series: Materials characterization series.Publisher: New York Momentum Press 2010Edition: 1st ed.Description: xiii, 240 p. ill. 25 cm.ISBN: 9781606501115 ; 1606501119 ; 9781606501092 ; 1606501097.Subject(s): Silicon | Electric conductorsItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Edited Book | Central Library, BUET Reading section | 620.1/STR/2010 (Browse shelf) | 1 | Available | 109718 |
Browsing Central Library, BUET Shelves , Shelving location: Reading section Close shelf browser
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620.1/SEE/1958 Analytical mechanics for engineers | 620.1/SHA/1960 Solutions to problems engineering mechanics | 620.1/SHA/2007 Introduction to materials science for engineers | 620.1/STR/2010 Characterization in silicon processing | 620.1/UCH/2010 Advanced piezoelectric materials | 620.1/VAN/1975 Elements of materials science and engineering | 620.1/VAN/1980 Elements of materials science and engineering |
Includes bibliographies
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