Neural models and algorithms for digital testing
by Chakradhar, Srimat T; Agrawal, Vishwani D; Bushnell, Michael L.
Series: Publisher: Boston Kluwer Academic Publishers 1991Edition: 1st ed.Description: xii, 184 p. ill. 25 cm.ISBN: 0792391659 .Subject(s): Logic circuits| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Book | Central Library, BUET Reading section | 623.95/CHA/1991 (Browse shelf) | 1 | Available | 90599 |
Browsing Central Library, BUET Shelves , Shelving location: Reading section Close shelf browser
| 623.95/BRA/1987 Design of VLSI systems | 623.95/BRA/1987 Design of VLSI systems | 623.95/BRO/1992 Field-programmable gate arrays | 623.95/CHA/1991 Neural models and algorithms for digital testing | 623.95/CHE/2003 VLSI technology | 623.95/CHE/2003 Logic design | 623.95/DEW/1990 Principles of VLSI system planning |
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