Fault-Tolerance and reliability techniques for high-density random-access memories
by Chakraborty, Kanad; Mazumder, Pinaki.
Publisher: New Delhi Prentice-Hall of India 2002Edition: 1st ed.Description: xix, 426p. ill.ISBN: 8178087693.Subject(s): Power semiconductors - Design and constructionItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Reading Item | Central Library, BUET Reading section | 623.815/CHA/2002 (Browse shelf) | 1 | Available | 101903 | |
Reading Item | Central Library, BUET Reading section | 623.815/CHA/2002 (Browse shelf) | 2 | Available | 101250 |
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623.815/CAR/1996 Circuit, device, and process simulation | 623.815/CHA/1985 Molecular beam epitaxy and heterostructures | 623.815/CHA/2002 Fault-Tolerance and reliability techniques for high-density random-access memories | 623.815/CHA/2002 Fault-Tolerance and reliability techniques for high-density random-access memories | 623.815/CHE/2003 Analog circuits and devices | 623.815/CHE/2003 Memory, microprocessor, and ASIC | 623.815/CHI/1965 Analysis and design of electronic circuits |
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