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Hot-carrier reliability of MOS VLSI circuits

by Leblebici, Yusuf; Kang, Sung-Mo.
Series: Publisher: London Kluwer Academic 1993Edition: 1st ed.Description: xvi, 212p. ill.ISBN: 079239352X.Subject(s): Integrated circuits - VLSI
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Item type Current location Call number Copy number Status Date due Barcode
Reading Item Central Library, BUET
Reading section 		623.95/LEB/1993 (Browse shelf) 1 Available 90607

Includes bibliographies

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