High resolution X-ray diffractometry and topography
by Bowen, D. Keith; Tanner, Brian K.
Publisher: London Taylor & Francis 1998Edition: 1st ed.Description: x, 252 p.ISBN: 0850667585.Subject(s): X-ray crystallographyItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
General Book | Central Library, BUET Reading section | 548.83/BOW/1998 (Browse shelf) | 1 | Available | 115383 |
Browsing Central Library, BUET Shelves , Shelving location: Reading section Close shelf browser
![]() |
![]() |
![]() |
![]() |
![]() |
![]() |
![]() |
||
548.81/VAI/2000 Structure of Crystals | 548.83/AUT/2001 Dynamical theory of x-ray diffraction | 548.83/BLA/2009 Crystal structure analysis | 548.83/BOW/1998 High resolution X-ray diffractometry and topography | 548.83/DAV/2002 Structure determination from powder diffraction data | 548.83/JEN/1996 Introduction to X-ray powder diffractometry | 548.83/PEC/2009 Fundamentals of powder diffraction and structural characterization of materials |
Includes bibliographies
There are no comments for this item.