Recombination lifetime measurements in silicon
by Workshop on silicon recombination lifetime characterization methods Santa Clara 06/02/1997; Gupta, Dinesh C; Sponsord by SEMI and ASTM Committee F1.
Series: ASTM special technical publication;1340.Publisher: West Conshohocken ASTM 1998Description: 392 p. ill. 24 cm.ISBN: 0803124899.Subject(s): SemiconductorsItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Proceedings | Central Library, BUET Circulation section | 623.815/WOR/1998 (Browse shelf) | 1 | Available | 99227 | |
Proceedings | Central Library, BUET Circulation section | 623.815/WOR/1998 (Browse shelf) | 2 | Available | 99388 | |
Proceedings | Central Library, BUET Circulation section | 623.815/WOR/1998 (Browse shelf) | 3 | Available | 99389 | |
Proceedings | Central Library, BUET Reference section | 623.815/WOR/1998 (Browse shelf) | 4 | Available | 99226 |
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623.815/WIL/2002 Nanotechnology | 623.815/WOL/1968 Computer-aided design of electronic circuits | 623.815/WOL/1971 Semiconductors | 623.815/WOR/1998 Recombination lifetime measurements in silicon | 623.815/WOR/1998 Recombination lifetime measurements in silicon | 623.815/WOR/1998 Recombination lifetime measurements in silicon | 623.815/XLA/1966 Fundamentals of reliable circuit design |
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