Recombination lifetime measurements in silicon
by Workshop on silicon recombination lifetime characterization methods Santa Clara 06/02/1997; Gupta, Dinesh C; Sponsord by SEMI and ASTM Committee F1.
Series: ASTM special technical publication;1340.Publisher: West Conshohocken ASTM 1998Description: 392 p. ill. 24 cm.ISBN: 0803124899.Subject(s): SemiconductorsItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Proceedings | Central Library, BUET Circulation section | 623.815/WOR/1998 (Browse shelf) | 1 | Available | 99227 | |
Proceedings | Central Library, BUET Circulation section | 623.815/WOR/1998 (Browse shelf) | 2 | Available | 99388 | |
Proceedings | Central Library, BUET Circulation section | 623.815/WOR/1998 (Browse shelf) | 3 | Available | 99389 | |
Proceedings | Central Library, BUET Reference section | 623.815/WOR/1998 (Browse shelf) | 4 | Available | 99226 |
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623.815/TAN/2023 Wide bandgap semiconductor based high performance bidirectional CLLL converter for electric vehicle application | 623.815/THO/1972 Handbook of electronic circuit design analysis | 623.815/WHI/2002 Electronic systems maintenance handbook | 623.815/WOR/1998 Recombination lifetime measurements in silicon | 623.815/ZBA/1994 Basic electronics | 623.81502/ALP/2009 Handbook of algorithms for physical design automation | 623.81502/ALP/2009 Handbook of algorithms for physical design automation |
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