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Fault-Tolerance and reliability techniques for high-density random-access memories

by Chakraborty, Kanad; Mazumder, Pinaki.
Publisher: New Delhi Prentice-Hall of India 2002Edition: 1st ed.Description: xix, 426p. ill.ISBN: 8178087693.Subject(s): Power semiconductors - Design and construction
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Item type Current location Call number Copy number Status Date due Barcode
Reading Item Central Library, BUET
Reading section 		623.815/CHA/2002 (Browse shelf) 1 Available 101903
Reading Item Central Library, BUET
Reading section 		623.815/CHA/2002 (Browse shelf) 2 Available 101250

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